Shallow traps-induced ultra-long lifetime of metal halide perovskites probed with light-biased time-resolved microwave conductivity
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Title
Shallow traps-induced ultra-long lifetime of metal halide perovskites probed with light-biased time-resolved microwave conductivity
Authors
Keywords
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Journal
Applied Physics Reviews
Volume 10, Issue 1, Pages 011406
Publisher
AIP Publishing
Online
2023-01-27
DOI
10.1063/5.0129883
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