ToF-SIMS Depth Profiling to Measure Nanoparticle and Polymer Diffusion in Polymer Melts

Title
ToF-SIMS Depth Profiling to Measure Nanoparticle and Polymer Diffusion in Polymer Melts
Authors
Keywords
-
Journal
Macromolecules
Volume 56, Issue 6, Pages 2277-2285
Publisher
American Chemical Society (ACS)
Online
2023-03-17
DOI
10.1021/acs.macromol.3c00033

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