Surface Dynamics of Field Evaporation in Silicon Carbide

Understanding the Nature of Crystallographic Bonds by Establishing the Correlation between Ion-Pair Chemistry and Their Separation in Detector Space

(2022) Olivia G. Licata et al.   MICROSCOPY AND MICROANALYSIS

Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN

(2022) Richard J.H. Morris et al.   ULTRAMICROSCOPY

Development of Wide Field of View Three-Dimensional Field Ion Microscopy and High-Fidelity Reconstruction Algorithms to the Study of Defects in Nuclear Materials

(2021) Benjamin Klaes et al.   MICROSCOPY AND MICROANALYSIS

Behavior of the ε-Ga2O3:Sn Evaporation During Laser-Assisted Atom Probe Tomography

(2021) Florian Chabanais et al.   MICROSCOPY AND MICROANALYSIS

Development of an Energy-Sensitive Detector for the Atom Probe Tomography

(2021) Christian Bacchi et al.   MICROSCOPY AND MICROANALYSIS

Atom Probe Tomography for Isotopic Analysis: Development of the 34S/32S System in Sulfides

(2021) Phillip Gopon et al.   MICROSCOPY AND MICROANALYSIS

A model to predict image formation in the three-dimensional field ion microscope

(2020) Benjamin Klaes et al.   COMPUTER PHYSICS COMMUNICATIONS

Exploring the Accuracy of Isotopic Analyses in Atom Probe Mass Spectrometry

(2020) Frederick Meisenkothen et al.   ULTRAMICROSCOPY

Atom probe tomography quantification of carbon in silicon

(2020) P Dumas et al.   ULTRAMICROSCOPY

Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography

(2020) E. Di Russo et al.   JOURNAL OF PHYSICAL CHEMISTRY A

Spatial and Compositional Biases Introduced by Position Sensitive Detection Systems in APT: A Simulation Approach

(2019) C. Bacchi et al.   MICROSCOPY AND MICROANALYSIS

Enhancing Element Identification by Expectation–Maximization Method in Atom Probe Tomography

(2019) Francois Vurpillot et al.   MICROSCOPY AND MICROANALYSIS

Unraveling the Metastability of Cn2+ (n = 2–4) Clusters

(2019) Zirong Peng et al.   Journal of Physical Chemistry Letters

Unique Bond Breaking in Crystalline Phase Change Materials and the Quest for Metavalent Bonding

(2018) Min Zhu et al.   ADVANCED MATERIALS

Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

(2018) E. Di Russo et al.   Journal of Physical Chemistry C

Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events

(2018) E. Di Russo et al.   ULTRAMICROSCOPY

Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparation

(2018) J. Bogdanowicz et al.   ULTRAMICROSCOPY

On the detection of multiple events in atom probe tomography

(2018) Zirong Peng et al.   ULTRAMICROSCOPY

Nanometer scale composition study of MBE grown BGaN performed by atom probe tomography

(2017) Bastien Bonef et al.   JOURNAL OF APPLIED PHYSICS

Electronic structure and stability of the SiO2+ dications produced in tomographic atom probe experiments

(2017) D. Zanuttini et al.   JOURNAL OF CHEMICAL PHYSICS

Field-Dependent Measurement of GaAs Composition by Atom Probe Tomography

(2017) Enrico Di Russo et al.   MICROSCOPY AND MICROANALYSIS

True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy

(2017) Francois Vurpillot et al.   MICROSCOPY AND MICROANALYSIS

Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N

(2016) L. Rigutti et al.   JOURNAL OF APPLIED PHYSICS

Dissociation Dynamics of Molecular Ions in High dc Electric Field

(2016) Ivan Blum et al.   JOURNAL OF PHYSICAL CHEMISTRY A

Composition Analysis of III-Nitrides at the Nanometer Scale: Comparison of Energy Dispersive X-ray Spectroscopy and Atom Probe Tomography

(2016) Bastien Bonef et al.   Nanoscale Research Letters

Behavior of molecules and molecular ions near a field emitter

(2016) Baptiste Gault et al.   NEW JOURNAL OF PHYSICS

Composition Analysis of III-Nitrides at the Nanometer Scale: Comparison of Energy Dispersive X-ray Spectroscopy and Atom Probe Tomography

(2016) Bastien Bonef et al.   Nanoscale Research Letters

Quantitative analysis of doped/undoped ZnO nanomaterials using laser assisted atom probe tomography: Influence of the analysis parameters

(2015) Nooshin Amirifar et al.   JOURNAL OF APPLIED PHYSICS

Quantitative investigation of SiGeC layers using atom probe tomography

(2015) Robert Estivill et al.   ULTRAMICROSCOPY

Effects of detector dead-time on quantitative analyses involving boron and multi-hit detection events in atom probe tomography

(2015) Frederick Meisenkothen et al.   ULTRAMICROSCOPY

Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field

(2014) Lorenzo Mancini et al.   Journal of Physical Chemistry C

Quantitative analysis of carbon in cementite using pulsed laser atom probe

(2014) H.S. Kitaguchi et al.   ULTRAMICROSCOPY

Role of Photoexcitation and Field Ionization in the Measurement of Accurate Oxide Stoichiometry by Laser-Assisted Atom Probe Tomography

(2013) A. Devaraj et al.   Journal of Physical Chemistry Letters

On the interaction of an ultra-fast laser with a nanometric tip by laser assisted atom probe tomography: A review

(2013) A. Vella   ULTRAMICROSCOPY

Spatial decomposition of molecular ions within 3D atom probe reconstructions

(2013) Andrew Breen et al.   ULTRAMICROSCOPY

Atom Probe Tomography of a-Axis GaN Nanowires: Analysis of Nonstoichiometric Evaporation Behavior

(2012) James R. Riley et al.   ACS Nano

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors

(2012) M. Müller et al.   JOURNAL OF APPLIED PHYSICS

Advance in multi-hit detection and quantization in atom probe tomography

(2012) G. Da Costa et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Characterizing Atomic Composition and Dopant Distribution in Wide Band Gap Semiconductor Nanowires Using Laser-Assisted Atom Probe Tomography

(2011) Ravi Agrawal et al.   Journal of Physical Chemistry C

Impact of directional walk on atom probe microanalysis

(2011) B. Gault et al.   ULTRAMICROSCOPY

Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography

(2010) B. Gault et al.   JOURNAL OF APPLIED PHYSICS

Surface relaxation and oxygen adsorption behavior of different SiC polytypes: a first-principles study

(2010) Junjie Wang et al.   JOURNAL OF PHYSICS-CONDENSED MATTER

On the multiplicity of field evaporation events in atom probe: A new dimension to the analysis of mass spectra

(2010) L. Yao et al.   PHILOSOPHICAL MAGAZINE LETTERS

Some aspects of the field evaporation behaviour of GaSb

(2010) M. Müller et al.   ULTRAMICROSCOPY

Laser assisted field evaporation of oxides in atom probe analysis

(2010) Y.M. Chen et al.   ULTRAMICROSCOPY

Quantitative atom probe analysis of carbides

(2010) M. Thuvander et al.   ULTRAMICROSCOPY

Correlated ion analysis and the interpretation of atom probe mass spectra

(2010) D.W. Saxey   ULTRAMICROSCOPY

Broadening the applications of the atom probe technique by ultraviolet femtosecond laser

(2010) K. Hono et al.   ULTRAMICROSCOPY