Advance in multi-hit detection and quantization in atom probe tomography

Field evaporation: A kinetic Monte Carlo approach on the influence of temperature

(2011) Maria Gruber et al.   SURFACE SCIENCE

Direct imaging of boron segregation to extended defects in silicon

(2010) S. Duguay et al.   APPLIED PHYSICS LETTERS

Atomic scale study of boron interstitial clusters in ion-implanted silicon

(2009) M. Ngamo et al.   JOURNAL OF APPLIED PHYSICS

Direct measurement of dopant distribution in an individual vapour–liquid–solid nanowire

(2009) Daniel E. Perea et al.   Nature Nanotechnology

Clustering and nearest neighbour distances in atom-probe tomography

(2009) T. Philippe et al.   ULTRAMICROSCOPY

Quantitative SIMS measurement of high concentration of boron in silicon (up to 20at.%) using an isotopic comparative method

(2008) Christiane Dubois et al.   APPLIED SURFACE SCIENCE

Laser-assisted atom probe tomography and nanosciences

(2008) Didier Blavette et al.   International Journal of Materials Research

Three-dimensional atomic-scale imaging of boron clusters in implanted silicon

(2008) O COJOCARUMIREDIN et al.   SCRIPTA MATERIALIA

Effect of laser pulsing on the composition measurement of an Al–Mg–Si–Cu alloy using three-dimensional atom probe

(2008) G. Sha et al.   ULTRAMICROSCOPY