Investigation on Impact of Doped HfO$_{2}$ Thin Film Ferro-Dielectrics on FDSOI NCFET Under Back-Gate Bias Influence
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Title
Investigation on Impact of Doped HfO$_{2}$ Thin Film Ferro-Dielectrics on FDSOI NCFET Under Back-Gate Bias Influence
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON NANOTECHNOLOGY
Volume 22, Issue -, Pages 14-19
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2022-12-24
DOI
10.1109/tnano.2022.3231693
References
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