MaMiNet: Memory-attended multi-inference network for surface-defect detection

Title
MaMiNet: Memory-attended multi-inference network for surface-defect detection
Authors
Keywords
-
Journal
COMPUTERS IN INDUSTRY
Volume 145, Issue -, Pages 103834
Publisher
Elsevier BV
Online
2022-12-11
DOI
10.1016/j.compind.2022.103834

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