Interfacial chemistry in a ZnTe/CdSe superlattice studied by atom probe tomography and transmission electron microscopy strain measurements

Atomic arrangement at ZnTe/CdSe interfaces determined by high resolution scanning transmission electron microscopy and atom probe tomography

(2015) Bastien Bonef et al.   APPLIED PHYSICS LETTERS

Artefacts in geometric phase analysis of compound materials

(2015) Jonathan J.P. Peters et al.   ULTRAMICROSCOPY

Lattice and strain analysis of atomic resolution Z-contrast images based on template matching

(2013) Jian-Min Zuo et al.   ULTRAMICROSCOPY

Atom probe crystallography

(2012) Baptiste Gault et al.   Materials Today

Determination of valence-band offset at cubic CdSe/ZnTe type-II heterojunctions: A combined experimental and theoretical approach

(2012) Daniel Mourad et al.   PHYSICAL REVIEW B

Atomistic simulations of the optical absorption of type-II CdSe/ZnTe superlattices

(2012) Soline Boyer-Richard et al.   Nanoscale Research Letters

Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography

(2010) B. Gault et al.   JOURNAL OF APPLIED PHYSICS

The effect of surface strain relaxation on HAADF imaging

(2009) V. Grillo   ULTRAMICROSCOPY

Measurement of specimen thickness and composition in AlxGa1-xN/GaN using high-angle annular dark field images

(2009) Andreas Rosenauer et al.   ULTRAMICROSCOPY