Optical proximity correction with hierarchical Bayes model

Title
Optical proximity correction with hierarchical Bayes model
Authors
Keywords
-
Journal
Journal of Micro-Nanolithography MEMS and MOEMS
Volume 15, Issue 2, Pages 021009
Publisher
SPIE-Intl Soc Optical Eng
Online
2016-03-12
DOI
10.1117/1.jmm.15.2.021009

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started