Influence of the Analysis Window on the Metrological Performance of the Grid Method
Published 2016 View Full Article
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Title
Influence of the Analysis Window on the Metrological Performance of the Grid Method
Authors
Keywords
Image-based contactless measurement, Displacement and strain maps, Grid method, Windowed Fourier analysis, Spatially correlated noise, Derivative of a random process, Wigner–Ville transform
Journal
JOURNAL OF MATHEMATICAL IMAGING AND VISION
Volume 56, Issue 3, Pages 472-498
Publisher
Springer Nature
Online
2016-04-05
DOI
10.1007/s10851-016-0650-z
References
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