Influence of the Analysis Window on the Metrological Performance of the Grid Method

标题
Influence of the Analysis Window on the Metrological Performance of the Grid Method
作者
关键词
Image-based contactless measurement, Displacement and strain maps, Grid method, Windowed Fourier analysis, Spatially correlated noise, Derivative of a random process, Wigner–Ville transform
出版物
JOURNAL OF MATHEMATICAL IMAGING AND VISION
Volume 56, Issue 3, Pages 472-498
出版商
Springer Nature
发表日期
2016-04-05
DOI
10.1007/s10851-016-0650-z

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