Applying the support vector machine with optimal parameter design into an automatic inspection system for classifying micro-defects on surfaces of light-emitting diode chips

Data selection based on decision tree for SVM classification on large data sets

(2015) Jair Cervantes et al.   APPLIED SOFT COMPUTING

Blob analyzation-based template matching algorithm for LED chip localization

(2015) Fuqiang Zhong et al.   INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY

Evolutionary Fuzzy ARTMAP Neural Networks for Classification of Semiconductor Defects

(2015) Shing Chiang Tan et al.   IEEE Transactions on Neural Networks and Learning Systems

Online State-Based Structured SVM Combined With Incremental PCA for Robust Visual Tracking

(2015) Yingjie Yin et al.   IEEE Transactions on Cybernetics

Surface defect detection in tiling Industries using digital image processing methods: Analysis and evaluation

(2014) Mohammad H. Karimi et al.   ISA TRANSACTIONS

Automatic inspection system of LED chip using two-stages back-propagation neural network

(2013) Chung-Feng Jeffrey Kuo et al.   JOURNAL OF INTELLIGENT MANUFACTURING

A Socially Inspired Framework for Human State Inference Using Expert Opinion Integration

(2011) Shrey Modi et al.   IEEE-ASME TRANSACTIONS ON MECHATRONICS

Automated defect inspection of light-emitting diode chips using neural network and statistical approaches

(2007) Hong-Dar Lin   EXPERT SYSTEMS WITH APPLICATIONS