Bayesian Active Learning for Scanning Probe Microscopy: From Gaussian Processes to Hypothesis Learning

Toward Decoding the Relationship between Domain Structure and Functionality in Ferroelectrics via Hidden Latent Variables

(2021) Sergei V. Kalinin et al.   ACS Applied Materials & Interfaces

Autonomous Experiments in Scanning Probe Microscopy and Spectroscopy: Choosing Where to Explore Polarization Dynamics in Ferroelectrics

(2021) Rama K. Vasudevan et al.   ACS Nano

Automated and Autonomous Experiments in Electron and Scanning Probe Microscopy

(2021) Sergei V. Kalinin et al.   ACS Nano

Probing Metastable Domain Dynamics via Automated Experimentation in Piezoresponse Force Microscopy

(2021) Kyle P. Kelley et al.   ACS Nano

Disentangling Ferroelectric Wall Dynamics and Identification of Pinning Mechanisms via Deep Learning

(2021) Yongtao Liu et al.   ADVANCED MATERIALS

The role of convolutional neural networks in scanning probe microscopy: a review

(2021) Ido Azuri et al.   Beilstein Journal of Nanotechnology

Ensemble learning-iterative training machine learning for uncertainty quantification and automated experiment in atom-resolved microscopy

(2021) Ayana Ghosh et al.   npj Computational Materials

Automated tip functionalization via machine learning in scanning probe microscopy

(2021) Benjamin Alldritt et al.   COMPUTER PHYSICS COMMUNICATIONS

Modeling the Motion of Ferroelectric Domain Walls with the Classical Stefan Problem

(2020) P. V. Yudin et al.   Physical Review Applied

Bayesian inference in band excitation scanning probe microscopy for optimal dynamic model selection in imaging

(2020) Rama K. Vasudevan et al.   JOURNAL OF APPLIED PHYSICS

Fast Scanning Probe Microscopy via Machine Learning: Non‐Rectangular Scans with Compressed Sensing and Gaussian Process Optimization

(2020) Kyle P. Kelley et al.   Small

Exploring physics of ferroelectric domain walls via Bayesian analysis of atomically resolved STEM data

(2020) Christopher T. Nelson et al.   Nature Communications

Autonomous Scanning Probe Microscopy in Situ Tip Conditioning through Machine Learning

(2018) Mohammad Rashidi et al.   ACS Nano

High-veracity functional imaging in scanning probe microscopy via Graph-Bootstrapping

(2018) Xin Li et al.   Nature Communications

Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) With Nonrectangular Scans

(2018) Xin Li et al.   MICROSCOPY AND MICROANALYSIS

Big, Deep, and Smart Data in Scanning Probe Microscopy

(2016) Sergei V. Kalinin et al.   ACS Nano

Compressive Sensing in Microscopy: a Tutorial

(2016) Andrew Stevens et al.   MICROSCOPY AND MICROANALYSIS

Data mining graphene: correlative analysis of structure and electronic degrees of freedom in graphenic monolayers with defects

(2016) Maxim Ziatdinov et al.   NANOTECHNOLOGY

Taking the Human Out of the Loop: A Review of Bayesian Optimization

(2016) Bobak Shahriari et al.   PROCEEDINGS OF THE IEEE

Atom-by-atom assembly

(2014) Saw Wai Hla   REPORTS ON PROGRESS IN PHYSICS

Understanding predictive information criteria for Bayesian models

(2013) Andrew Gelman et al.   STATISTICS AND COMPUTING

Spectroscopic imaging in piezoresponse force microscopy: New opportunities for studying polarization dynamics in ferroelectrics and multiferroics

(2012) R.K. Vasudevan et al.   MRS Communications

Particle Simulations of Planetary Probe Flows Employing Automated Mesh Refinement

(2011) Da Gao et al.   JOURNAL OF SPACECRAFT AND ROCKETS

Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

(2011) D.A. Bonnell et al.   MRS BULLETIN

Local Electrochemical Functionality in Energy Storage Materials and Devices by Scanning Probe Microscopies: Status and Perspectives

(2010) Sergei V. Kalinin et al.   ADVANCED MATERIALS

New SPM techniques for analyzing OPV materials

(2010) Rajiv Giridharagopal et al.   Materials Today

Functional recognition imaging using artificial neural networks: applications to rapid cellular identification via broadband electromechanical response

(2009) M P Nikiforov et al.   NANOTECHNOLOGY

Adaptive probe trajectory scanning probe microscopy for multiresolution measurements of interface geometry

(2009) Oleg S Ovchinnikov et al.   NANOTECHNOLOGY

Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy

(2009) Stephen Jesse et al.   NANOTECHNOLOGY

Topological surface states protected from backscattering by chiral spin texture

(2009) Pedram Roushan et al.   NATURE

Rapid multidimensional data acquisition in scanning probe microscopy applied to local polarization dynamics and voltage dependent contact mechanics

(2008) Stephen Jesse et al.   APPLIED PHYSICS LETTERS

A Knowledge-Gradient Policy for Sequential Information Collection

(2008) Peter I. Frazier et al.   SIAM JOURNAL ON CONTROL AND OPTIMIZATION