A Large-Scale Empirical Study on the Vulnerability of Deployed IoT Devices

Published 2020 View Full Article

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Title
A Large-Scale Empirical Study on the Vulnerability of Deployed IoT Devices
Authors
Keywords
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Journal
IEEE Transactions on Dependable and Secure Computing
Volume 19, Issue 3, Pages 1826-1840
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2020-11-14
DOI
10.1109/tdsc.2020.3037908

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