Fruit yield prediction and estimation in orchards: A state-of-the-art comprehensive review for both direct and indirect methods

Title
Fruit yield prediction and estimation in orchards: A state-of-the-art comprehensive review for both direct and indirect methods
Authors
Keywords
Orchard management, Yield prediction and estimation, Machine learning, Machine vision, Deep learning
Journal
COMPUTERS AND ELECTRONICS IN AGRICULTURE
Volume 195, Issue -, Pages 106812
Publisher
Elsevier BV
Online
2022-02-26
DOI
10.1016/j.compag.2022.106812

Ask authors/readers for more resources

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now