4.6 Article

Improved Multibit Storage Reliabilityby Design of Ferroelectric Modulated Antiferroelectric Memory

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 69, Issue 4, Pages 2145-2150

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2021.3139054

Keywords

Antiferroelectric (AFE); device-to-device variation; ferroelectric (FE); multibit storage; nonvolatile memory

Funding

  1. Key-Area Research and Development Program of Guangdong Province [2019B010145001]
  2. National Natural Science Foundation of China [616340084, 61704188, 61922083, 61804167]
  3. Strategic Priority Research Program of the Chinese Academy of Sciences (CAS) [XDB44000000]

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This article presents a new concept of ferroelectric modulated antiferroelectric memory with independent two-step state switching and large polarization, which is considered as a promising option for multibit storage in advanced technology nodes. The stability and reliability of this new memory concept are verified through mathematical modeling and experimental demonstrations.
In this article, we presented a new concept of ferroelectric (FE) modulated antiferroelectric (AFE) memory with independent two-step state switching and large polarization as a promising option for multibit storage in advanced technology nodes. Based on the Landau- Ginzburg-Devonshire (LGD) theory, four nonvolatile states of AFE with the built-in field can be obtained, and the step-by-step switching among four states was successfully simulated through pulse engineering; then, stable nonvolatile 2-bit storage was experimentally demonstrated in FE/AFE/FE capacitor device, and 0.97-MV/cm bipolar built-in field introduced by FE polarization switching was extracted. The FE + AFE device showed double-peak coercive electric field (E-c) distribution and large remanent polarization (P-r) of 16.9 mu C/cm(2) with good process stability. Finally, benefitting from the independently step-by-step switching and large density of effective FE domain, the improved multibit storage reliability was verified by kinetic Monte Carlo (KMC) modeling compared to conventional multibit technology.

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