A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding

Authors

Keywords

Journal

Volume -, Issue -, Pages 1-1

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2022-01-22

DOI

10.1109/jssc.2022.3141370

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