Photoluminescence and Reliability Study of ZnO Cosputtered IGZO Thin-Film Transistors Under Various Ambient Conditions

Published 2016 View Full Article

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Title
Photoluminescence and Reliability Study of ZnO Cosputtered IGZO Thin-Film Transistors Under Various Ambient Conditions
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 63, Issue 4, Pages 1578-1581
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2016-02-25
DOI
10.1109/ted.2016.2525799

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