Photoluminescence and Reliability Study of ZnO Cosputtered IGZO Thin-Film Transistors Under Various Ambient Conditions

标题
Photoluminescence and Reliability Study of ZnO Cosputtered IGZO Thin-Film Transistors Under Various Ambient Conditions
作者
关键词
-
出版物
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 63, Issue 4, Pages 1578-1581
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2016-02-25
DOI
10.1109/ted.2016.2525799

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