Study of Random Variation in Germanium-Source Vertical Tunnel FET

Published 2016 View Full Article

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Title
Study of Random Variation in Germanium-Source Vertical Tunnel FET
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 63, Issue 5, Pages 1827-1834
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2016-03-19
DOI
10.1109/ted.2016.2539209

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