Study of Random Variation in Germanium-Source Vertical Tunnel FET

标题
Study of Random Variation in Germanium-Source Vertical Tunnel FET
作者
关键词
-
出版物
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 63, Issue 5, Pages 1827-1834
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2016-03-19
DOI
10.1109/ted.2016.2539209

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