Transferred Deep Convolutional Neural Network Features for Extensive Facial Landmark Localization

Title
Transferred Deep Convolutional Neural Network Features for Extensive Facial Landmark Localization
Authors
Keywords
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Journal
IEEE SIGNAL PROCESSING LETTERS
Volume 23, Issue 4, Pages 478-482
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2016-02-24
DOI
10.1109/lsp.2016.2533721

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