Deeply sub-wavelength non-contact optical metrology of sub-wavelength objects

Label-free deeply subwavelength optical microscopy

(2020) T. Pu et al.   APPLIED PHYSICS LETTERS

Unlabeled Far‐Field Deeply Subwavelength Topological Microscopy (DSTM)

(2020) Tanchao Pu et al.   Advanced Science

Replacing libraries in scatterometry

(2018) Jonas Skovlund Møller Madsen et al.   OPTICS EXPRESS

Fourier-Transform Ghost Imaging with Hard X Rays

(2016) Hong Yu et al.   PHYSICAL REVIEW LETTERS

Achieving the ultimate optical resolution

(2016) Martin Paúr et al.   Optica

Solving the inverse grating problem by white light interference Fourier scatterometry

(2012) Valeriano Ferreras Paz et al.   Light-Science & Applications

X-Ray Diffraction Microscopy

(2010) Pierre Thibault et al.   Annual Review of Condensed Matter Physics

Super-resolution and reconstruction of sparse sub-wavelength images

(2009) Snir Gazit et al.   OPTICS EXPRESS

A novel ultra-high speed camera for digital image processing applications

(2008) A Hijazi et al.   MEASUREMENT SCIENCE and TECHNOLOGY

Metrology of optically-unresolved features using interferometric surface profiling and RCWA modeling

(2008) Peter De Groot et al.   OPTICS EXPRESS