Interfacial reaction, shear behavior and microhardness of Cu-Sn TLP bonding joints bearing CuZnAl powder for 3D packaging
Published 2021 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Interfacial reaction, shear behavior and microhardness of Cu-Sn TLP bonding joints bearing CuZnAl powder for 3D packaging
Authors
Keywords
Bonding joints, Interfacial reaction, Shear behavior, Microhardness
Journal
Journal of Manufacturing Processes
Volume 68, Issue -, Pages 1672-1682
Publisher
Elsevier BV
Online
2021-07-09
DOI
10.1016/j.jmapro.2021.06.073
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Diversifying grain orientation and expediting 10 μm Cu/Sn/Cu TLP bonding process with Ni doping
- (2021) Yu-Ching Wang et al. Journal of Materials Science: Materials in Electronics
- Effect of microstructure aspects on mechanical properties of nanoparticle-assisted transient liquid phase (NP-TLP) joints for AZ31 alloy
- (2021) F. Dehnavi et al. Journal of Manufacturing Processes
- Four Dimensional (4D) Microstructural Evolution of Cu6Sn5 Intermetallic and Voids under Electromigration in Bi-crystal Pure Sn Solder Joints
- (2020) Marion Branch Kelly et al. ACTA MATERIALIA
- Inhibition of intermetallic compounds growth at Sn–58Bi/Cu interface bearing CuZnAl memory particles (2–6 μm)
- (2020) Liang Zhang et al. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
- Fast formation of Cu-Sn intermetallic joints using pre-annealed Sn/Cu/Sn composite preform for high-temperature bonding applications
- (2020) So-Eun Jeong et al. THIN SOLID FILMS
- Microstructure evolution and mechanical properties of ultrasonically TLP bonded Mg joint
- (2020) Zhiwu Xu et al. Journal of Manufacturing Processes
- Materials modification of the lead-free solders incorporated with micro/nano-sized particles: A review
- (2020) Mu-lan Li et al. MATERIALS & DESIGN
- Effect of CuZnAl particles addition on microstructure of Cu/Sn58Bi/Cu TLP bonding solder joints
- (2019) Mingyue Xiong et al. VACUUM
- Tensile deformation and microstructures of Sn–3.0Ag–0.5Cu solder joints: Effect of annealing temperature
- (2019) Wenbin Tang et al. MICROELECTRONICS RELIABILITY
- Effect of addition of CuZnAl particle on the properties of Sn solder joint
- (2019) Lei Sun et al. JOURNAL OF MATERIALS PROCESSING TECHNOLOGY
- Evolution behavior and growth kinetics of intermetallic compounds at Sn/Cu interface during multiple reflows
- (2018) H.R. Ma et al. INTERMETALLICS
- Pronounced effects of Zn additions on Cu-Sn microjoints for chip-stacking applications
- (2018) Y.W. Wang et al. JOURNAL OF ALLOYS AND COMPOUNDS
- A study of Ni 3 Sn 4 growth dynamics in Ni-Sn TLPS bonding process by differential scanning calorimetry
- (2018) Hongliang Feng et al. THERMOCHIMICA ACTA
- Effect of stress triaxiality on damage evolution of porous solder joints in IGBT Discretes
- (2018) Majid Samavatian et al. Journal of Manufacturing Processes
- Mechanical behaviour of sintered silver nanoparticles reinforced by SiC microparticles
- (2018) Xu Long et al. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
- Influence of Ni particle addition on grain refinement of Cu-Sn intermetallic compound joints bonded at various temperatures
- (2018) X.J. Guo et al. JOURNAL OF ALLOYS AND COMPOUNDS
- Recent advances on kinetic analysis of solder joint reactions in 3D IC packaging technology
- (2018) K.N. Tu et al. MATERIALS SCIENCE & ENGINEERING R-REPORTS
- Effect of Intermetallic Compounds on the Thermomechanical Fatigue Life of Three-Dimensional Integrated Circuit Package Microsolder Bumps: Finite Element Analysis and Study
- (2015) Soud Farhan Choudhury et al. JOURNAL OF ELECTRONIC PACKAGING
- Effects of silver addition on Cu–Sn microjoints for chip-stacking applications
- (2014) T.L. Yang et al. JOURNAL OF ALLOYS AND COMPOUNDS
- Effects of Y2O3 Nanoparticles on Growth Behaviors of Cu6Sn5 Grains in Soldering Reaction
- (2013) L. M. Yang et al. JOURNAL OF ELECTRONIC MATERIALS
- Degradation of Cu6Sn5 intermetallic compound by pore formation in solid–liquid interdiffusion Cu/Sn microbump interconnects
- (2013) Iuliana Panchenko et al. MICROELECTRONIC ENGINEERING
- The Cu–Sn phase diagram, Part I: New experimental results
- (2012) S. Fürtauer et al. INTERMETALLICS
- Kirkendall voids formation in the reaction between Ni-doped SnAg lead-free solders and different Cu substrates
- (2008) Y.W. Wang et al. MICROELECTRONICS RELIABILITY
Find Funding. Review Successful Grants.
Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.
ExploreAdd your recorded webinar
Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.
Upload Now