Intragranular strain estimation in far-field scanning X-ray diffraction using a Gaussian process
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Title
Intragranular strain estimation in far-field scanning X-ray diffraction using a Gaussian process
Authors
Keywords
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Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 54, Issue 4, Pages 1057-1070
Publisher
International Union of Crystallography (IUCr)
Online
2021-06-15
DOI
10.1107/s1600576721005112
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