An ultra-wide scanner for large-area high-speed atomic force microscopy with megapixel resolution

Title
An ultra-wide scanner for large-area high-speed atomic force microscopy with megapixel resolution
Authors
Keywords
-
Journal
Scientific Reports
Volume 11, Issue 1, Pages -
Publisher
Springer Science and Business Media LLC
Online
2021-06-21
DOI
10.1038/s41598-021-92365-y

Ask authors/readers for more resources

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started