Modeling and correction of image pixel hysteresis in atomic force microscopy

Published 2020 View Full Article

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Title
Modeling and correction of image pixel hysteresis in atomic force microscopy
Authors
Keywords
Atomic force microscopy, Image pixel hysteresis model, Measurement accuracy
Journal
ULTRAMICROSCOPY
Volume 213, Issue -, Pages 112992
Publisher
Elsevier BV
Online
2020-04-28
DOI
10.1016/j.ultramic.2020.112992

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