Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 1020 cm−3
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Title
Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 1020 cm−3
Authors
Keywords
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Journal
Scientific Reports
Volume 11, Issue 1, Pages -
Publisher
Springer Science and Business Media LLC
Online
2021-09-15
DOI
10.1038/s41598-021-97253-z
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