Hole diffusion profile in a p-p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry

Authors

Keywords

Journal

Volume 95, Issue 3, Pages 032102

Publisher

AIP Publishing

Online

2009-07-21

DOI

10.1063/1.3184567

Explore over 38,000 international journals covering a vast array of academic fields.

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now