Residual stresses in additively manufactured AlSi10Mg: Raman spectroscopy and X-ray diffraction analysis
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Title
Residual stresses in additively manufactured AlSi10Mg: Raman spectroscopy and X-ray diffraction analysis
Authors
Keywords
Residual stress, X-ray diffraction (XRD), Raman spectroscopy, AlSi10Mg, Additive Manufacturing
Journal
MATERIALS & DESIGN
Volume 202, Issue -, Pages 109550
Publisher
Elsevier BV
Online
2021-02-05
DOI
10.1016/j.matdes.2021.109550
References
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