Journal
NANOMATERIALS
Volume 11, Issue 4, Pages -Publisher
MDPI
DOI: 10.3390/nano11040968
Keywords
scanning electron microscopy; mask R-CNN; deep learning; particle size distribution; instance segmentation; TiO2; agglomerate
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The study utilizes the Mask-RCNN algorithm to address the size characterization of particles present in form of agglomerates in SEM images, showing improved accuracy compared to traditional image processing methods. Results obtained on titanium dioxide samples demonstrate the reliability of Mask-RCNN in this case study, with a DICE coefficient average value reaching 0.95 on test images.
The size characterization of particles present in the form of agglomerates in images measured by scanning electron microscopy (SEM) requires a powerful image segmentation tool in order to properly define the boundaries of each particle. In this work, we propose to use an algorithm from the deep statistical learning community, the Mask-RCNN, coupled with transfer learning to overcome the problem of generalization of the commonly used image processing methods such as watershed or active contour. Indeed, the adjustment of the parameters of these algorithms is almost systematically necessary and slows down the automation of the processing chain. The Mask-RCNN is adapted here to the case study and we present results obtained on titanium dioxide samples (non-spherical particles) with a level of performance evaluated by different metrics such as the DICE coefficient, which reaches an average value of 0.95 on the test images.
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