Quantitative Analysis on Resistance Fluctuation of Resistive Random Access Memory by Low Frequency Noise Measurement

Published 2021 View Full Article

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Title
Quantitative Analysis on Resistance Fluctuation of Resistive Random Access Memory by Low Frequency Noise Measurement
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 42, Issue 3, Pages 312-314
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2021-01-07
DOI
10.1109/led.2021.3049655

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