A new framework to map fine resolution cropping intensity across the globe: Algorithm, validation, and implication

Title
A new framework to map fine resolution cropping intensity across the globe: Algorithm, validation, and implication
Authors
Keywords
Cropping intensity, Remote sensing, Multiple sensors, NDVI time series, Crop phenophase
Journal
REMOTE SENSING OF ENVIRONMENT
Volume 251, Issue -, Pages 112095
Publisher
Elsevier BV
Online
2020-09-18
DOI
10.1016/j.rse.2020.112095

Ask authors/readers for more resources

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More