Structural and optical effects of low dose rate Co-60 gamma irradiation on PbS thin films

Influence of gamma irradiation on the properties of PbS thin films

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Effect of low dose-rate industrial Co-60 gamma irradiation on ZnO thin films: Structural and optical study

(2019) A. Ismail et al.   MICROELECTRONICS RELIABILITY

Effects of Deposition Time on the Morphology, Structure, and Optical Properties of PbS Thin Films Prepared by Chemical Bath Deposition

(2018) B. Abdallah et al.   Journal of Nanomaterials

Optical and Structural Study of ZnO Thin Films Deposited by RF Magnetron Sputtering at Different Thicknesses: a Comparison with Single Crystal

(2018) Abdul Kader Jazmati et al.   Materials Research-Ibero-american Journal of Materials

Physical, optical and sensing properties of sprayed zinc doped tin oxide films

(2018) B. Abdallah et al.   OPTIK

50 keV H+ ion beam irradiation of Al doped ZnO thin films: Studies of radiation stability for device applications

(2017) Susanta Kumar Sahoo et al.   SURFACE AND INTERFACE ANALYSIS

Structural, morphological, optical, and photoluminescence properties of nanocrystalline PbS thin films grown by chemical bath deposition

(2017) S. Rajathi et al.   Arabian Journal of Chemistry

Ultrasensitive PbS quantum-dot-sensitized InGaZnO hybrid photoinverter for near-infrared detection and imaging with high photogain

(2016) Do Kyung Hwang et al.   NPG Asia Materials

Thickness effect on stress, structural, electrical and sensing properties of (0 0 2) preferentially oriented undoped ZnO thin films

(2015) S. Al-Khawaja et al.   COMPOSITE INTERFACES

AlN thin films deposited by DC reactive magnetron sputtering: effect of oxygen on film growth

(2013) Javier García Molleja et al.   EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS

Nanomaterial Enabled Biosensors for Pathogen Monitoring - A Review

(2010) Peter J. Vikesland et al.   ENVIRONMENTAL SCIENCE & TECHNOLOGY

A Printed and Flexible Field-Effect Transistor Device with Nanoscale Zinc Oxide as Active Semiconductor Material

(2008) Jörg J. Schneider et al.   ADVANCED MATERIALS