On line detection of defective apples using computer vision system combined with deep learning methods

Title
On line detection of defective apples using computer vision system combined with deep learning methods
Authors
Keywords
Apple, Defects, Convolutional neural network, SVM, Deep learning
Journal
JOURNAL OF FOOD ENGINEERING
Volume 286, Issue -, Pages 110102
Publisher
Elsevier BV
Online
2020-04-29
DOI
10.1016/j.jfoodeng.2020.110102

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