Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize
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Title
Genome-wide association mapping reveals novel sources of resistance to northern corn leaf blight in maize
Authors
Keywords
Quantitative Trait Locus, Association Mapping, Best Linear Unbiased Prediction, Disease Parameter, Association Panel
Journal
BMC PLANT BIOLOGY
Volume 15, Issue 1, Pages -
Publisher
Springer Nature
Online
2015-08-19
DOI
10.1186/s12870-015-0589-z
References
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