Bias stress instability in multilayered MoTe 2 field effect transistors under DC and pulse‐mode operation

Title
Bias stress instability in multilayered MoTe 2 field effect transistors under DC and pulse‐mode operation
Authors
Keywords
-
Journal
ELECTRONICS LETTERS
Volume -, Issue -, Pages -
Publisher
Institution of Engineering and Technology (IET)
Online
2021-01-21
DOI
10.1049/ell2.12019

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