Fluorinated CYTOP passivation effects on the electrical reliability of multilayer MoS2 field-effect transistors

Published 2015 View Full Article

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Title
Fluorinated CYTOP passivation effects on the electrical reliability of multilayer MoS2 field-effect transistors
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 26, Issue 45, Pages 455201
Publisher
IOP Publishing
Online
2015-10-16
DOI
10.1088/0957-4484/26/45/455201

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