Key Role of Oxygen-Vacancy Electromigration in the Memristive Response of Ferroelectric Devices
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Title
Key Role of Oxygen-Vacancy Electromigration in the Memristive Response of Ferroelectric Devices
Authors
Keywords
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Journal
Physical Review Applied
Volume 14, Issue 4, Pages -
Publisher
American Physical Society (APS)
Online
2020-10-24
DOI
10.1103/physrevapplied.14.044045
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