Origin of resistance state relaxation and nonvolatile features in NiO films: Interfacial vs filamentary resistive switching
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Title
Origin of resistance state relaxation and nonvolatile features in NiO films: Interfacial vs filamentary resistive switching
Authors
Keywords
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Journal
AIP Advances
Volume 10, Issue 10, Pages 105319
Publisher
AIP Publishing
Online
2020-10-14
DOI
10.1063/5.0007173
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