A high-speed atomic force microscopy with super resolution based on path planning scanning

Published 2020 View Full Article

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Title
A high-speed atomic force microscopy with super resolution based on path planning scanning
Authors
Keywords
Atomic force microscopy, High-speed scanning, Super resolution, Convolutional neural network, Path planning
Journal
ULTRAMICROSCOPY
Volume 213, Issue -, Pages 112991
Publisher
Elsevier BV
Online
2020-04-07
DOI
10.1016/j.ultramic.2020.112991

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