A high-speed atomic force microscopy with super resolution based on path planning scanning

出版年份 2020 全文链接

标题

作者

关键词

Atomic force microscopy, High-speed scanning, Super resolution, Convolutional neural network, Path planning

出版物

Volume 213, Issue -, Pages 112991

出版商

Elsevier BV

发表日期

2020-04-07

DOI

10.1016/j.ultramic.2020.112991

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