Machine Learning for Seed Quality Classification: An Advanced Approach Using Merger Data from FT-NIR Spectroscopy and X-ray Imaging

Title
Machine Learning for Seed Quality Classification: An Advanced Approach Using Merger Data from FT-NIR Spectroscopy and X-ray Imaging
Authors
Keywords
-
Journal
SENSORS
Volume 20, Issue 15, Pages 4319
Publisher
MDPI AG
Online
2020-08-03
DOI
10.3390/s20154319

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started