Fault diagnosis and prognosis based on physical knowledge and reliability data: Application to MOS Field-Effect Transistor

Published 2020 View Full Article

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Title
Fault diagnosis and prognosis based on physical knowledge and reliability data: Application to MOS Field-Effect Transistor
Authors
Keywords
Remaining useful life, Trend modeling, Wiener process, Fault detection and isolation, Fault prognosis
Journal
MICROELECTRONICS RELIABILITY
Volume 110, Issue -, Pages 113682
Publisher
Elsevier BV
Online
2020-05-28
DOI
10.1016/j.microrel.2020.113682

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