Direct ellipsometry for non-destructive characterization of interfacially-polymerized thin-film composite membranes

Published 2020 View Full Article

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Title
Direct ellipsometry for non-destructive characterization of interfacially-polymerized thin-film composite membranes
Authors
Keywords
Ellipsometry, Thin-film composite membrane, Reverse osmosis, Membrane characterization, Interfacial polymerization
Journal
JOURNAL OF MEMBRANE SCIENCE
Volume 608, Issue -, Pages 118174
Publisher
Elsevier BV
Online
2020-04-30
DOI
10.1016/j.memsci.2020.118174

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