An active learning high-throughput microstructure calibration framework for solving inverse structure–process problems in materials informatics

Published 2020 View Full Article

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Title
An active learning high-throughput microstructure calibration framework for solving inverse structure–process problems in materials informatics
Authors
Keywords
Microstructure descriptors, Bayesian optimization, Process–structure, Additive manufacturing, Grain growth, Kinetic Monte Carlo, ICME
Journal
ACTA MATERIALIA
Volume 194, Issue -, Pages 80-92
Publisher
Elsevier BV
Online
2020-05-19
DOI
10.1016/j.actamat.2020.04.054

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