An active learning high-throughput microstructure calibration framework for solving inverse structure–process problems in materials informatics

出版年份 2020 全文链接

标题

作者

关键词

Microstructure descriptors, Bayesian optimization, Process–structure, Additive manufacturing, Grain growth, Kinetic Monte Carlo, ICME

出版物

Volume 194, Issue -, Pages 80-92

出版商

Elsevier BV

发表日期

2020-05-19

DOI

10.1016/j.actamat.2020.04.054

联系作者

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started