Aqueous solution-processed AlOx dielectrics and their biased radiation response investigated by an on-site technique

Published 2019 View Full Article

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Title
Aqueous solution-processed AlOx dielectrics and their biased radiation response investigated by an on-site technique
Authors
Keywords
Solution-processed, High-k gate dielectric, AlO, x, capacitor, Biased γ-ray radiation stress stability, On-site radiation measurements
Journal
RADIATION PHYSICS AND CHEMISTRY
Volume 170, Issue -, Pages 108644
Publisher
Elsevier BV
Online
2019-12-10
DOI
10.1016/j.radphyschem.2019.108644

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