Automated electron temperature fitting of Langmuir probe I-V trace in plasmas with multiple Maxwellian EEDFs

Published 2020 View Full Article

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Title
Automated electron temperature fitting of Langmuir probe I-V trace in plasmas with multiple Maxwellian EEDFs
Authors
Keywords
-
Journal
PLASMA SCIENCE & TECHNOLOGY
Volume -, Issue -, Pages -
Publisher
IOP Publishing
Online
2020-03-13
DOI
10.1088/2058-6272/ab7f3d

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