Automated electron temperature fitting of Langmuir probe I-V trace in plasmas with multiple Maxwellian EEDFs

标题
Automated electron temperature fitting of Langmuir probe I-V trace in plasmas with multiple Maxwellian EEDFs
作者
关键词
-
出版物
PLASMA SCIENCE & TECHNOLOGY
Volume -, Issue -, Pages -
出版商
IOP Publishing
发表日期
2020-03-13
DOI
10.1088/2058-6272/ab7f3d

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