Damage Localization of Stacker’s Track Based on EEMD-EMD and DBSCAN Cluster Algorithms

Published 2019 View Full Article

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Title
Damage Localization of Stacker’s Track Based on EEMD-EMD and DBSCAN Cluster Algorithms
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 69, Issue 5, Pages 1981-1992
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-06-05
DOI
10.1109/tim.2019.2919375

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